Reduction of appearance artifacts in wearableon- skin electronics

Author

Y. Liu, S. Ito, T. Kato, L. Wang, Y. Zhu, S. D. Mulatier, H. Arao, S. Suwazono, H. Asano, Y. Zhou, H. Mitomo, H. Gong, O. Nomura, G. Kagawa, N. Watanabe, M. H. Behfar, Y. Kuroiwa, T. Tatsuma, Y. Sugano, H. Takahashi, M. Asai, J. Kang, N. Matsuhisa

Journal

Science Advances

Year

2026

Link

https://www.science.org/doi/10.1126/sciadv.aee6417 153회 연결

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